Oxford Instruments Asylum Research today announced the release of AR Maps, a new, powerful data analysis software package for the Jupiter XR atomic force microscope (AFM). AR Maps provides roughness information based on ISO standards, generates statistical reports, performs critical dimension and trench analysis, performs grain analysis, and more. The new AR Maps software package comes with all new Jupiter XR AFM systems and is available as an upgrade for existing customers.
“Jupiter XR offers scanning capabilities that are x5-x20 faster than traditional AFMs, high-resolution imaging performance that improves accuracy and precision, measurement stability and repeatability,said Dr. Ben Ohler, senior product line manager at Oxford Instruments Asylum Research. “Asylum Research is working to enhance the efficiency of Jupiter AFM. So, in addition to the Advanced Automation software package introduced a few months ago, we are now offering AR Maps, which provides powerful offline analysis capabilities.
The capabilities of AR maps will be introduced in the Asylum Research webinar, “Best Practices in Critical Dimension Measurements Using AFM: Probe Selection and Data Analysis,” scheduled for May 15.Day 8 AM and 6 PM PDT. To register for this event, go to https://afm.oxinst.com/webinars/.
AR map software for Jupiter XR AFM
AR mapping software for Jupiter XR AFM. Video Credit: Asylum Research – Oxford Instruments Company
Source: https://afm.oxinst.com/